From Good to Great: Parameter Tuning in Memory Tiering Systems

IEEE Transactions on Computers 2026

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Authors: Konstantinos Kanellis, Sujay Yadalam, Hayden Coffey, Shivaram Venkataraman, Michael Swift
DOI: 10.1109/tc.2026.3656472
Cited by: 2
References: 30

Fields of Study & Subjects

Parallel Computing and Optimization Techniques Distributed systems and fault tolerance Ferroelectric and Negative Capacitance Devices

Publication details

Journal / source
IEEE Transactions on Computers
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
75
Issue
4
Pages
1378–1390
Publication date
21 January 2026