Read Performance Optimization Strategies for Temporary Read Error in High Density 3D NAND Flash Memory

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2026

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Authors: Longbin Chen, Ruibin Zhou, Jian Huang, Yuyi Wang, Xianping Liu, Xinrui Zhang, Zhiyi Yu
DOI: 10.1109/tcad.2026.3656765
Cited by: 1
References: 53

Fields of Study & Subjects

Advanced Data Storage Technologies Error Correcting Code Techniques Parallel Computing and Optimization Techniques

Publication details

Journal / source
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
45
Issue
10
Pages
1–1
Publication date
1 January 2026