Understanding and Mitigating Errors of LLM-Generated RTL Code
Fields of Study & Subjects
Formal Methods in Verification
Software Testing and Debugging Techniques
Radiation Effects in Electronics
Publication details
- Journal / source
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Pages
- 1–1
- Publication date
- 1 January 2026