Adaptive Noise-Resilient Test-Time Adaptation for RF Signal Recognition

IEEE Transactions on Cognitive Communications and Networking 2026

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Authors: Haoran Zha, Hanhong Wang, Ziwei Zhang, Hongtao Zhan, Guan Gui, Yun Lin
DOI: 10.1109/tccn.2026.3657107
Cited by: 1
References: 36

Fields of Study & Subjects

VLSI and Analog Circuit Testing Wireless Signal Modulation Classification Machine Fault Diagnosis Techniques

Publication details

Journal / source
IEEE Transactions on Cognitive Communications and Networking
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
12
Pages
6685–6697
Publication date
1 January 2026