Auxiliary Information Flow for 3D Industrial Defect Detection on IC Ceramic Package Substrate Surfaces: Dataset and Benchmark

IEEE Transactions on Circuits and Systems for Video Technology 2026

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Authors: Ruiyun Yu, Ziming Zhao, Shi Zhen
DOI: 10.1109/tcsvt.2026.3656960
Cited by: 1
References: 63

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Advanced Neural Network Applications Big Data and Digital Economy

Publication details

Journal / source
IEEE Transactions on Circuits and Systems for Video Technology
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
36
Issue
6
Pages
7444–7456
Publication date
22 January 2026