Adaptive Semi-Supervised Random Forest for Transformer Fault Diagnosis in the case of limited labeled data

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Authors: Yanling Lv, Huiyu Huang, Yao Wang, D Zhang
Cited by: 1

Abstract

Transformer fault diagnosis based on dissolved gas analysis (DGA) is often constrained by two practical conditions: limited fault labels and pronounced class imbalance. To address these constraints, we propose an adaptive semi-supervised random forest framework (Adaptive-SSRF) that incorporates unlabeled DGA observations while controlling the risk of error propagation from pseudo-labeling. The framework integrates three mechanisms. First, a Confidence-Anchored, Performance-Scaled (CAPS) weighting scheme assigns pseudo-label weights as a function of prediction confidence and validation performance, moderating the influence of medium-confidence cases in early iterations. Second, an out-of-bag (OOB) individual review procedure updates a seniority score for each adopted pseudo-label and down-weights observations that repeatedly conflict with the model’s internal consensus. Third, a trust-stratified augmentation strategy generates synthetic samples preferentially around high-trust regions to alleviate imbalance without mechanically equalizing class counts. Using real-world DGA datasets, Adaptive-SSRF improves performance relative to supervised and self-training baselines across multiple label regimes. At a 10% labeled ratio, it achieves 79.76% average accuracy and exhibits reduced variance across repeated splits. Ablation analyses indicate that each mechanism contributes substantively to gains under low-label conditions. The proposed framework offers a practical approach to learning reliable diagnostic models when labels are scarce and the empirical class distribution is skewed.

Fields of Study & Subjects

Power Systems Fault Detection Power Transformer Diagnostics and Insulation Machine Fault Diagnosis Techniques

Publication details

Journal / source
IEEE Transactions on Dielectrics and Electrical Insulation
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Pages
1–1
Publication date
1 January 2026