Design and Reliability Assessment of a Reconfigurable Tunneling Device for Ultra Low-Power Applications

IEEE Transactions on Device and Materials Reliability 2026

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Authors: Bandi Venkata Chandan, Kaushal Nigam, Adil Tanveer
DOI: 10.1109/tdmr.2026.3708312
Cited by: 1
References: 30

Fields of Study & Subjects

Semiconductor materials and devices Radiation Effects in Electronics Low-power high-performance VLSI design

Publication details

Journal / source
IEEE Transactions on Device and Materials Reliability
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
26
Issue
3
Pages
1–1
Publication date
1 January 2026