Fine-Grained Detection and Analysis of Unknown Encrypted Malicious Traffic From Mixed Noisy Labels
Abstract
The efficacy of deep learning-based Network Intrusion Detection Systems (NIDS) is critically constrained by the availability of high-quality labeled data. In real-world environments, datasets often suffer from mixed label noise—consisting of both closed-set and open-set noise—which significantly distorts decision boundaries and leads to critical security misses for previously unknown attacks. Achieving robust classification of known traffic while accurately detecting unknown threats in the presence of such mixed noise remains a key challenge. In this paper, we introduceSieve, a robust framework designed for the fine-grained detection and analysis of unknown encrypted malicious traffic in mixed noise conditions. Sieve consists of three collaborative modules: (i) a noise-resilient label correction module that filters out mixed noise using neighbor consistency metrics and confidence-based subset expansion; (ii) a post-hoc detection module that employs Mahalanobis distance in a purified, compact feature space to identify unknown traffic; and (iii) an unknown traffic labeling module that utilizes semi-supervised clustering to facilitate efficient updates of the dataset. Empirical evaluations across four public datasets demonstrate that Sieve significantly outperforms state-of-the-art methods in both known-class classification and unknown-threat detection. Notably, on the Mal_TLS2023 dataset under 50% noise conditions, Sieve maintains robust performance, with accuracy and F1 scores exceeding 94%. Further theoretical analyses corroborate the superiority of the Sieve framework. The code is available at:https://github.com/niebikong/Sieve.
Fields of Study & Subjects
Internet Traffic Analysis and Secure E-voting
Chaos-based Image/Signal Encryption
Cryptographic Implementations and Security
Publication details
- Journal / source
- IEEE Transactions on Dependable and Secure Computing
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Volume
- 23
- Issue
- 5
- Pages
- 10035–10052
- Publication date
- 28 May 2026