Bias Amplification in RAG: Poisoning Knowledge Retrieval to Steer LLMs

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Authors: Linlin Wang, Tianqing Zhu, Lu Qin, Longxiang Gao, Wanlei Zhou
Cited by: 1
References: 47

Abstract

In Large Language Models, Retrieval-Augmented Generation (RAG) systems can significantly enhance the performance of large language models by integrating external knowledge. However, RAG also introduces new security risks. Existing research focuses mainly on how poisoning attacks in RAG systems affect model output quality, overlooking their potential to amplify model biases. For example, when querying about domestic violence victims, a compromised RAG system might preferentially retrieve documents depicting women as victims, causing the model to generate outputs that perpetuate gender stereotypes even when the original query is gender neutral. To show the impact of the bias, this paper proposes a Bias Retrieval and Reward Attack (BRRA) framework, which systematically investigates attack pathways that amplify language model biases through a RAG system manipulation. We design an adversarial document generation method based on multi-objective reward functions, employ subspace projection techniques to manipulate retrieval results, and construct a cyclic feedback mechanism for continuous bias amplification. Experiments on multiple mainstream large language models demonstrate that BRRA attacks can significantly enhance model biases in dimensions. In addition, we explore a dual stage defense mechanism to effectively mitigate the impacts of the attack. This study reveals that poisoning attacks in RAG systems directly amplify model output biases and clarifies the relationship between RAG system security and model fairness. This novel potential attack indicates that we need to keep an eye on the fairness issues of the RAG system.

Fields of Study & Subjects

Topic Modeling Natural Language Processing Techniques Biomedical Text Mining and Ontologies

Publication details

Journal / source
IEEE Transactions on Dependable and Secure Computing
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
23
Issue
5
Pages
11033–11050
Publication date
2 July 2026
Language
EN