Small-Signal-Based Characterization of DC-Induced Off-State High-Field Trap Effects in 14-nm FinFETs

IEEE Transactions on Electron Devices 2026

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Authors: Alan Y. Otero-Carrascal, Purushothaman Srinivasan, Oscar Huerta-Gonzalez, Héctor A. Uribe, Edmundo A. Gutiérrez-Domínguez, Reydezel Torres-Torres
DOI: 10.1109/ted.2026.3656254
Cited by: 1
References: 30

Fields of Study & Subjects

Advancements in Semiconductor Devices and Circuit Design Semiconductor materials and devices Integrated Circuits and Semiconductor Failure Analysis

Publication details

Journal / source
IEEE Transactions on Electron Devices
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
73
Issue
3
Pages
1176–1185
Publication date
6 February 2026