Impact of Access Transistor Degradation on the Reliability of Sub-40 nm 1T1R RRAM Arrays: Characterization and Modeling

IEEE Transactions on Electron Devices 2026

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Authors: Yuhang Yang, Z. M. Wang, H Wang, Lin Bao, Qishen Wang, Runsheng Wang, Yimao Cai
DOI: 10.1109/ted.2026.3658648
Cited by: 1
References: 31

Fields of Study & Subjects

Advancements in Semiconductor Devices and Circuit Design VLSI and Analog Circuit Testing Integrated Circuits and Semiconductor Failure Analysis

Publication details

Journal / source
IEEE Transactions on Electron Devices
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
73
Issue
3
Pages
1366–1371
Publication date
6 February 2026