Analysis of the Structure of the Roughness Profile of the mm-Band Gyrotron Resonator and Comparison With Theoretical Models

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Authors: D. A. Kotova, Антон Сергеевич Седов, Dmitry Borisovich Radishev
Cited by: 0
References: 11

Abstract

Determining the ohmic$Q$-factor of gyrotron resonators in the millimeter wavelength range requires accounting for the surface roughness, which is incorporated via the effective conductivity coefficient${k}_{\textit {skin}}$. Although most calculation models for gyrotrons assume this value to be 2, its precise determination for a specific surface remains a relevant task. In this work, a theoretical approach previously developed for a model of the roughness profiles is applied to a real resonator. The surface profile was measured, the obtained data were processed, and the effective conductivity, along with the corresponding${k}_{\textit {skin}}$coefficient, was determined. The results obtained can determine both the main parameters of the roughness profile and the limits of applicability of the theoretical model used.

Fields of Study & Subjects

Gyrotron and Vacuum Electronics Research Surface Roughness and Optical Measurements Electromagnetic Scattering and Analysis

Publication details

Journal / source
IEEE Transactions on Electron Devices
Volume
73
Issue
4
Pages
2230–2235
Publication date
26 February 2026
Language
EN