Active Gate Drivers for SiC MOSFETs: Circuitry, Control, and Future Outlook

Read full text
Authors: Nart Gashi, Chengmin Li, Yoganandam Vivekanandham Pushpalatha, Georgios Papafotiou, Dimosthenis Peftitsis
Cited by: 2
References: 83

Abstract

The development of silicon carbide (SiC) MOSFETs has enabled the design of power electronic converters with significantly higher efficiency, power density, and maximum allowed operating temperatures. Gate driver circuits are essential for fully exploiting the superior electrothermal capabilities of SiC MOSFETs. Conventional gate drivers rely on fixed designs that limit performance improvements under varying load conditions—conditions commonly encountered in emerging applications, such as renewable energy systems and electric vehicles (EVs). In contrast, active gate drivers (AGDs) allow s dynamic adjustment of switching and conduction behavior to meet specific performance objectives. However, effective AGD control requires computationally demanding algorithms operating in real time. This article presents an overview of key AGDs designs and compares three prominent real-time control approaches for AGDs: model-based, partial-model-based, and model-free. All three approaches have been experimentally validated, and key results are presented and analyzed. Future perspectives of AGDs design and operation are also discussed.

Fields of Study & Subjects

Silicon Carbide Semiconductor Technologies Advancements in Semiconductor Devices and Circuit Design Semiconductor materials and devices

Publication details

Journal / source
IEEE Transactions on Electron Devices
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
73
Issue
6
Pages
3252–3266
Publication date
30 March 2026
Language
EN