Dissipativity-Based Multiport Stability Root-Cause Identification and Mitigation for Solid-State Transformers

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Authors: Xiangyu Meng, Dong Xie, Hongjian Lin, Chunxu Lin, Xinglai Ge, Zhigang Liu
Cited by: 27
References: 35

Abstract

For solid-state transformers (SSTs) in high-power grid-connected applications, improperly designed control loops can excite strong inherent AC-DC port coupling, leading to low-frequency oscillation issues, especially under weak grid conditions. To address this problem, this article establishes a multiport admittance matrix for the SST, encompassing its AC$\boldsymbol{dq}$axes and primary DC port, to characterize its inherent dynamics. Subsequently, a multiport dissipativity analysis is conducted to evaluate the robust stability of SST. By leveraging the decomposition of passivity conditions into distinct self- and coupling-dissipativity indices, the specific root causes of instability are diagnosed. This framework reveals that a severe coupling-dissipativity failure, induced by the internal dynamics of the synchronization loop, is the dominant instability mechanism rather than a localized self-dissipativity issue. Guided by this diagnosis, a stabilizing controller featuring dynamics-free orthogonal signal reconstruction is designed to reshape the admittance characteristics of the SST. This enhancement specifically targets the identified coupling-dissipativity deficiencies, thereby resolving the root cause of the instability. Finally, the stability analysis and the effectiveness of the enhancement strategy are validated on a down-scaled SST prototype. Experimental results demonstrate that the criterion accurately predicts the coupling-induced oscillations and that the enhanced controller guarantees stable operation under challenging weak-grid conditions.

Fields of Study & Subjects

Microgrid Control and Optimization Magneto-Optical Properties and Applications Power Transformer Diagnostics and Insulation

Publication details

Journal / source
IEEE Transactions on Industrial Electronics
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
73
Issue
7
Pages
9850–9862
Publication date
12 February 2026