End-to-End Open-Set Semi-Supervised Learning for Fine-Grained Encrypted Traffic Classification
Abstract
Encrypted traffic classification is crucial for enhancing network management, service quality, and security. However, real-world network environments are inherently open-world scenarios in which traffic not only consists of known classes but also includes the continuous emergence of unknown classes. Existing deep learning methods typically rely on the closed-world assumption, which significantly limits their classification performance when dealing with unknown traffic types. This limitation makes it challenging to accurately classify known traffic classes and effectively identify unknown ones. Although few studies have focused on open-world scenarios, these methods often use staged strategies and struggle to reliably detect unknown traffic or to estimate novel classes. To address these challenges, we propose an end-to-end Fine-grained Encrypted traffic Classification method based on Open-set Semi-supervised Learning, called FEC-OSL. This method comprises three mutually reinforcing core components. First, we design a dual-branch flow feature extraction module to capture detailed and discriminative flow features. Second, we introduce a novel energy-based perspective that leverages energy-boundary learning to distinguish known traffic from unknown traffic, enabling precise detection of known classes. Finally, an adaptive deep clustering approach integrates feature learning with clustering to achieve fine-grained classification of unknown flows. We conduct extensive experiments on three real-world datasets, and the results validate that our proposed method exhibits outstanding performance in handling both known and unknown encrypted traffic in open-world scenarios.
Fields of Study & Subjects
Internet Traffic Analysis and Secure E-voting
Network Security and Intrusion Detection
Legal and Policy Issues
Publication details
- Journal / source
- IEEE Transactions on Information Forensics and Security
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Volume
- 21
- Pages
- 1347–1362
- Publication date
- 1 January 2026