PHANTOM: Power Hammering Attack and Countermeasure on Multi-Tenant ReRAM Compute-in-Memory Accelerators

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Authors: Ashish Reddy Bommana, Rajendra Bishnoi, Naghmeh Karimi, Farshad Firouzi, Krishnendu Chakrabarty
Cited by: 4
References: 53

Abstract

The increasing demand for efficient and low-power deep neural network (DNN) inference has advanced the adoption of ReRAM-based compute-in-memory (CiM) accelerators, which perform computations directly within memory to reduce energy consumption and enhance throughput. However, such architectures are vulnerable to security threats, especially in a multi-tenant environment where multiple users share the same physical resources. This paper introduces a new attack model for multi-tenant ReRAM-based CiM, power hammering, that exploits the temperature sensitivity of ReRAM cells, inducing local temperature increases that lead to conductance drift and ultimately result in erroneous inference outcomes. This serves as a denial-of-service (DoS) attack, where malicious co-tenants degrade inferencing accuracy and system reliability for legitimate users in a shared environment, ultimately undermining trust and causing potential losses to the service provider. Additionally, we propose a novel strategy to counter this security vulnerability. In this technique, we focus on selectively protecting important weights with error compensation hardware. These important weights are treated as faults, and their computation is offloaded to compensation hardware. Simulation results confirm the effectiveness of the proposed method in ensuring accurate classification results even under adversarial conditions, thereby enabling secure multi-tenant inference on ReRAM-based CiM accelerators.

Fields of Study & Subjects

Advanced Memory and Neural Computing Security and Verification in Computing Physical Unclonable Functions (PUFs) and Hardware Security

Publication details

Journal / source
IEEE Transactions on Information Forensics and Security
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
21
Pages
1606–1621
Publication date
1 January 2026