PromptFuzz: Harnessing Fuzzing Techniques for Robust Testing of Prompt Injection in LLMs

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Authors: Yangguang Shao, Jiahao Yu, Hanwen Miao, Gaopeng Gou, Zhen Li, Junzheng Shi
Cited by: 1
References: 21

Abstract

Large Language Models (LLMs) have gained widespread use in various applications due to their powerful capability to generate human-like text. However, prompt injection attacks, which involve overwriting a model’s original instructions with malicious prompts to manipulate the generated text, have raised significant concerns about the security and reliability of LLMs. In this paper, we propose PromptFuzz, a novel testing framework that leverages fuzzing techniques to systematically assess the robustness of LLMs against prompt injection attacks. Inspired by software fuzzing, PromptFuzz selects promising seed prompts and generates a diverse set of prompt injections to evaluate the target LLM’s resilience. PromptFuzz operates in two stages: theprepare phase, which involves selecting promising initial seeds and collecting few-shot examples, and thefocus phase, which uses the collected examples to generate diverse, high-quality prompt injections. By deploying the generated attack prompts from PromptFuzz in a real-world competition, we achieved the 7th ranking out of over 4000 participants (top 0.14%) within 2 hours, demonstrating PromptFuzz’s effectiveness compared to experienced human attackers. Additionally, we also deploy the generated attack prompts on 50 popular LLM-integrated online applications, including those from Coze and OpenAI, and found that 92% of them can be exploited by PromptFuzz. We also run PromptFuzz on 15 online LLM-based resume judging applications and found that 13 of these applications’ responses can be hijacked by PromptFuzz.

Fields of Study & Subjects

VLSI and Analog Circuit Testing Software Testing and Debugging Techniques Engineering and Test Systems

Publication details

Journal / source
IEEE Transactions on Information Forensics and Security
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
21
Pages
2727–2741
Publication date
1 January 2026