Are Large Vision-Language Models Robust to Adversarial Visual Transformations?

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Authors: Daizong Liu, Xiaowen Cai, Pan Zhou, Xiaoye Qu, Lichao Sun, Wei Hu
Cited by: 1
References: 39

Abstract

Large vision-language models (LVLMs) have demonstrated remarkable capabilities across a wide range of multimodal understanding and reasoning tasks. However, recent research shows that LVLMs are susceptible to adversarial examples. Existing attackers either optimize the perturbations on the visual input or manipulate prompts to fool the LVLM models, requiring extensive design and engineering on these adversarial manipulations. While straightforward visual transformation can boast training generalization-ability, its potential risks to LVLMs in terms of safety and trustworthiness have been largely neglected. In this paper, we ask an intriguing question:can simple yet easy-to-implement adversarial visual transformations be utilized to attack the LVLM models?Motivated by this research gap and new attack setting, we propose the first comprehensive assessment of LVLMs’ adversarial robustness to visual transformations by testing LVLMs’ resilience to all possible transformation operations. Our empirical observations suggest that with the appropriate combination of the most harmful transformations, we can build transformation-based attacks more adversarial to the LVLM models. Moreover, adversarial learning of visual transformations is further introduced to adaptively apply the malicious impacts of all potentially harmful transformations to the raw images via gradient approximation for improving the attack effectiveness and imperceptibility. We hope that this study can provide deeper insights into the potential vulnerability of LVLMs to adversarial visual transformations.

Fields of Study & Subjects

Multimodal Machine Learning Applications Adversarial Robustness in Machine Learning Generative Adversarial Networks and Image Synthesis

Publication details

Journal / source
IEEE Transactions on Information Forensics and Security
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
21
Pages
2564–2579
Publication date
1 January 2026