Universal Fault Diagnosis With Unknown Label Space of Machineries Based on Evaluate-Match-Constrain Transfer Network

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Authors: Fuzheng Liu, Xiaolin Liu, Chenglong Ye, Xuebin Lv, Haidong Shao, Faye Zhang, Mingshun Jiang
Cited by: 1
References: 23

Abstract

The high-end machineries often suffer from a scarcity of labeled fault samples under alternating load conditions. In addition, class transitions often hinder diagnosis performance. To address these challenges, the evaluate-match-constrain transfer network (EMC-TNet) is proposed, which includes three components: stochastic confident estimation (SCE), enhanced weighted matching (EWM), and interactive refined constraint (IRC). The SCE enhances high-confidence estimations by designing stochastic auxiliary classifiers, achieving the division of known–unknown samples under swarm intelligence. The EWM suppresses private classes of source samples and achieves the effective supervision of target samples by generating enhanced weighted labels through the sample classifier. In addition, it improves discrimination between known–unknown samples by assigning weights via auxiliary classifiers. The IRC refines the classifier discrimination threshold adopting the Shannon entropy weighting strategy and the consistency decision mechanism from dual classifiers, achieving high-precision recognition of known–unknown samples. The effectiveness of the EMC-TNet has been verified on different mechanical testbeds.

Fields of Study & Subjects

Machine Fault Diagnosis Techniques Anomaly Detection Techniques and Applications Fault Detection and Control Systems

Publication details

Journal / source
IEEE Transactions on Industrial Informatics
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
22
Issue
4
Pages
3330–3340
Publication date
12 January 2026