FPF: A Focused Perception Framework for Small Defect Identification in Complex Power Scenarios

IEEE Transactions on Industrial Informatics 2026

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Authors: Hui Zhang, Hang Liu, Baheti Biekezati, Rui Du, Yunkang Cao, Kaining Zhang, Tongzhi Niu, Yaonan Wang
DOI: 10.1109/tii.2025.3649024
Cited by: 2
References: 28

Fields of Study & Subjects

Explainable Artificial Intelligence (XAI) Structural Health Monitoring Techniques VLSI and Analog Circuit Testing

Publication details

Journal / source
IEEE Transactions on Industrial Informatics
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
22
Issue
4
Pages
2793–2804
Publication date
21 January 2026