Scenario Equivalent Decoupling-Based Optimal Cost Control Strategy for Power Systems Considering N–1 Security and Uncertainties

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Authors: Dapeng Wang, Cong Zhang, Huaizhi Yang, Lili He, Long Zeng, J W Li, Lipeng Zhu, Ke Zhou, Lei Xie, Julong Chen, Zhikang Shuai
Cited by: 3
References: 25

Abstract

This article proposes a novel N–1 interval optimal power flow (NIOPF) scheme that considers N–1 contingencies and interval uncertainties in renewable generation. Based on the scenario-equivalent decoupling method (SEDM), the NIOPF addresses the problems associated with existing methods, including constraint violations and low solution efficiency. First, the NIOPF model is formulated by integrating security constraints involving interval variables under both N–0 normal and N–1 contingency scenarios, along with scenario transition constraints. Second, a credible domain reduction method (CDRM) based on the Minkowski difference is proposed to handle interval constraints, converting them into tractable deterministic constraints that guarantee the system operates within safe limits across all uncertain scenarios. Then, the SEDM represents numerous N–1 scenarios equivalently as two positive and negative deviation scenarios, effectively reducing the dimensionality of N–1 scenarios. Next, a two-stage optimization model that integrates the N–0 normal operating scenario with the two equivalent deviation scenarios is constructed and solved iteratively to improve computational efficiency. Finally, case studies on the modified IEEE 30-bus system verify that the proposed SEDM ensures constraint satisfaction under uncertainties while improving computational efficiency. Further tests on the modified IEEE 118-bus and PEGASE 1354-bus systems confirm its engineering applicability.

Fields of Study & Subjects

Frequency Control in Power Systems Power System Optimization and Stability Smart Grid Security and Resilience

Publication details

Journal / source
IEEE Transactions on Industrial Informatics
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
22
Issue
9
Pages
8139–8150
Publication date
21 May 2026