Large Selective Receptive Field Network for Multiclass Surface Defects

IEEE Transactions on Instrumentation and Measurement 2026

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Authors: Lu Han, Changqing Wang, Qiangwen Fu, Dong Niu, Nan Li
DOI: 10.1109/tim.2026.3652736
Cited by: 2
References: 27

Fields of Study & Subjects

Neural Networks and Reservoir Computing Advanced Neural Network Applications Machine Learning in Materials Science

Publication details

Journal / source
IEEE Transactions on Instrumentation and Measurement
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
75
Pages
1–10
Publication date
1 January 2026