A Unified Local-to-Global Framework for Geometric Calibration of Multisource Static CT
Fields of Study & Subjects
Advanced Measurement and Metrology Techniques
Optical measurement and interference techniques
Advanced X-ray and CT Imaging
Publication details
- Journal / source
- IEEE Transactions on Instrumentation and Measurement
- Volume
- 75
- Pages
- 1–12
- Publication date
- 1 January 2026