2CLIP-SAM: Dual-Mask-Guided CLIP and SAM Collaboration for Coating Adhesion Detection on Oriented Silicon Steel
Fields of Study & Subjects
Nanofabrication and Lithography Techniques
Surface Roughness and Optical Measurements
Copper Interconnects and Reliability
Publication details
- Journal / source
- IEEE Transactions on Instrumentation and Measurement
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Volume
- 75
- Pages
- 1–15
- Publication date
- 1 January 2026