Amplitude and Phase Errors Calibration for MIMO-SAR Based on PAST and Joint Optimization via Image Entropy Minimization

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Authors: Bo Wang, Tao Lai, Haifeng Huang, Qingsong Wang
Cited by: 1
References: 32

Abstract

Multiple-Input Multiple-Output Synthetic Aperture Radar (MIMO-SAR) enhances imaging resolution by extending the virtual aperture without increasing the physical size of the antenna. However, its multichannel architecture inevitably introduces amplitude and phase inconsistencies, which significantly degrade image quality. Existing calibration methods typically rely on high-SNR reference targets, but the bistatic geometry inherent to MIMO-SAR systems, combined with the non-ideal scattering characteristics of reference targets, introduces significant estimation bias in channel amplitude and phase calibration. To address this issue, a minimum deployment distance threshold for trihedral corner reflector-based calibration is first determined to mitigate bistatic-induced disturbances. Then, a two-step estimation strategy is proposed to effectively suppress residual errors and improve the accuracy of calibration. Specifically, the initial estimation of amplitude and phase errors is obtained using the Projection Approximation Subspace Tracking algorithm. Subsequently, fine correction is achieved by minimizing image entropy, employing a joint optimization scheme based on Adamax and the Conjugate Gradient method, which enhances convergence stability and avoids local minima. Simulation and experimental results confirm the effectiveness of the proposed method in accurately estimating channel mismatches and substantially enhancing imaging quality. Furthermore, measured data demonstrate its robustness and applicability in high-precision imaging under complex observation conditions.

Fields of Study & Subjects

Advanced SAR Imaging Techniques Synthetic Aperture Radar (SAR) Applications and Techniques Sparse and Compressive Sensing Techniques

Publication details

Journal / source
IEEE Transactions on Instrumentation and Measurement
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
75
Pages
1–15
Publication date
1 January 2026