Quantification and Validation of Fatigue Life Differences in Push-the-Bit Rotary Steerable Systems via Vibration Pattern Measurement
Abstract
Downhole high-frequency measurement is critical for preventing costly failures of Push-the-Bit Rotary Steerable Systems (PTB-RSS). However, the differences in fatigue life under multi-mode vibrations have not been clearly identified using existing measurement and interpretation methods. This study establishes a multi-boundary coupled dynamics model of PTB-RSS, validated with field measurements, which incorporates steering force friction, bit–rock interaction, and BHA–borehole contact mechanisms. Validation using high-frequency field data showed a Pearson correlation coefficient of 0.933 for rotational speed, close agreement in acceleration spectral characteristics, and an average error of only 6.13% in steering displacement compared to theoretical values, confirming the model’s high fidelity in reproducing key downhole vibration patterns. Stress signals obtained from the validated model were processed using the rainflow counting method. The results indicate that stick–slip vibration reduces the fatigue life of the BHA by at least 68.38%, while high-frequency whirl and torsional vibrations reduce it by more than 90%. Moreover, when the steering force approaches 30 kN, it readily excites high-frequency vibration in the BHA, significantly shortening its service life. The core methodological innovation of this study lies in establishing a validated dynamics model that serves as a virtual sensor. This model enables the first translation of measurable vibration patterns into quantified fatigue life differences, thereby providing an operable, measurement-driven technical framework for predicting BHA fatigue life based on high-frequency dynamic signal measurements.
Fields of Study & Subjects
Drilling and Well Engineering
Asphalt Pavement Performance Evaluation
Hydraulic Fracturing and Reservoir Analysis
Publication details
- Journal / source
- IEEE Transactions on Instrumentation and Measurement
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Volume
- 75
- Pages
- 1–20
- Publication date
- 1 January 2026