MAFSRM: A Multiangle Feature Separation and Reconstruction Module for Industrial Defect Detection

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Authors: Zongshuai Zhang, Ying Gao, Lvwei Zhu, Eric Rigall, Xinjing Wang, Junyu Dong
Cited by: 0
References: 40

Abstract

In industrial manufacturing, the measurability of surface defects directly impacts the accuracy of quality assessment and the effectiveness of process control. While object detection-based methods can rapidly localize defects, they often fall short in supporting high-fidelity visual measurement due to several critical challenges: the strict sub-second timing required by high-speed production lines, the interference from complex backgrounds that distorts geometric and edge information, and the low salience and diversity of small-scale defects, which hampers the extraction of stable, measurement-relevant features. To address these issues, we propose a plug-and-play Multi-Angle Feature Separation and Reconstruction Module (MAFSRM), designed to enhance the quality and robustness of defect features from a measurement perspective. MAFSRM consists of three submodules: (1) Spatial Pyramid Pooling-Fast Separation and Reconstruction (SPPFSR) for fast, scale-adaptive feature extraction; (2) Weight Separation and Reconstruction (WSR) for isolating defect regions from background interference in the spatial domain; (3) Feature Separation and Reconstruction (FSR) for enhancing defect distinctiveness by refining channel-level feature representations. The module can be seamlessly integrated into mainstream single-stage detection frameworks, enabling easy deployment without altering the existing pipeline. Experiments on NEU-DET, GC10-DET, PCB, and a self-constructed Tire-DET dataset show that MAFSRM significantly improves both detection accuracy and feature stability, offering highly reliable inputs for downstream measurements of defect size and morphology.

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Infrastructure Maintenance and Monitoring Non-Destructive Testing Techniques

Publication details

Journal / source
IEEE Transactions on Instrumentation and Measurement
Volume
75
Pages
1–13
Publication date
1 January 2026