Self-Supervised CLIP-Guided for Few-Shot Industrial Anomaly Detection

IEEE Transactions on Instrumentation and Measurement 2026

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Authors: Yingwen Chen, Ying Wu Xu, Tianlei Wang, Yikui Zhai, Kanghong Tan, Jianhong Zhou, Pasquale Coscia, Angelo Genovese, C L Philip Chen

DOI: 10.1109/tim.2026.3661696

Cited by: 0

References: 53

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Anomaly Detection Techniques and Applications Domain Adaptation and Few-Shot Learning

References 53