Robust Hierarchical Traveling-Wave Partial Discharge Localization for Efficient Insulation Defect Detection of Medium-Voltage Overhead Lines

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Authors: Yuan Yan, Lei Jin, Junbai Chen, Yang Yang, Hongjie Li
Cited by: 1
References: 36

Abstract

Medium-voltage overhead lines typically span kilometers, yet classical partial discharge (PD) detection methods are limited to meter-scale ranges, resulting in inefficient inspection. Traveling-wave PD localization provides a kilometer-scale monitoring solution that addresses this fundamental mismatch in spatial scale. However, its field deployment is hindered by insufficient detector sensitivity and severe reliability degradation caused by noise, frequency-dependent attenuation, and wave reflections in complex line environments. To address these challenges, this paper introduces a “global-to-local” detection methodology that enables both large-scale screening and equipment-level identification through hierarchical time-difference-of-arrival and polarity analysis. A dedicated detector has been developed, incorporating a non-invasive high-frequency current transformer and an ultra-low-noise amplifier capable of resolving sub-100 μA PD pulses, all synchronized via the Global Navigation Satellite System for multi-terminal acquisition. A dual-domain processing framework further enhances system robustness by integrating autocorrelation-guided reflection suppression in the time domain with adaptive subband fusion in the frequency domain, compensating for frequency-dependent attenuation while suppressing interference. Validation through simulation, laboratory tests, and field deployment confirms accurate defect localization under realistic noise and reflection conditions, demonstrating the practical viability of the system.

Fields of Study & Subjects

High voltage insulation and dielectric phenomena Thermal Analysis in Power Transmission Power Systems Fault Detection

Publication details

Journal / source
IEEE Transactions on Instrumentation and Measurement
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
75
Pages
1–15
Publication date
1 January 2026