Multi-Camera Calibration With Imperfect 3-D Targets for Imaging Biological Systems

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Authors: Robin Laven, Thiranja Prasad Babarenda Gamage, Alexander W. Dixon, Gonzalo D. Maso Talou, Merryn Howatson Tawhai, Andrew James Taberner, Martyn Peter Nash, Poul M. F. Nielsen
Cited by: 1
References: 21

Abstract

High-resolution multi-view stereo camera systems provide an opportunity for precise measurement of shapes, deformations, and displacements. These systems are especially useful for instrumentation and measurement of small-scale biological systems. Often, these are so precise that their measurements have greater precision than the achievable manufacturing precision of calibration targets, limiting the accuracy of template-based calibrations. This work extends the calibration of camera systems using imperfect planar calibration targets to 3D targets, allowing robust calibration of these high-resolution stereo systems. Results are reported for three separate camera systems, designed for human-scale, skin surface, and single-organ imaging. Recovery of target imperfections, to within 20 μm for a 40 mm target, and improved reprojection errors are demonstrated. The proposed calibration of imperfect targets is shown to be more robust to imperfections in the points chosen to constrain the calibration than previous methods. For systems with relatively precise targets, small improvements are shown in calibration results (from 0.91 pixels to 0.59 pixels of Euclidean error) with limited change in measurements from the system. For imprecise targets, the results show notable improvements in reprojection errors (improving from 4.30 pixels to 1.34 pixels and 5.85 pixels to 0.61 pixels of Euclidean error) and improvements in reconstruction based measurement, reconstructing an additional 10% of the subject.

Fields of Study & Subjects

Optical measurement and interference techniques Image Processing Techniques and Applications Cell Image Analysis Techniques

Publication details

Journal / source
IEEE Transactions on Instrumentation and Measurement
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
75
Pages
1–8
Publication date
1 January 2026