STID: A Two-Stage Cascade Framework for Defect-Annotation-Free Insulator Defect Detection

IEEE Transactions on Instrumentation and Measurement 2026

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Authors: Chao Han, Di Wu, Benben Cui, Feng Shuang

DOI: 10.1109/tim.2026.3709419

Cited by: 1

References: 21

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Advanced Neural Network Applications Software System Performance and Reliability

References 21