Harnessing Group-Oriented Consistency Constraints for Semi-Supervised Semantic Segmentation in CdZnTe Semiconductors

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Authors: Peihao Li, Yan Fang, Man Ru Liu, Huihui Bai, Anhong Wang, Yunchao Wei, Yao Zhao
Cited by: 0
References: 40

Abstract

Labeling Cadmium Zinc Telluride (CdZnTe) semiconductor images is challenging due to the low-contrast defect boundaries, necessitating annotators to cross-reference multiple views. These views share a single ground truth (GT), forming a unique "many-to-one" relationship. This characteristic renders advanced semi-supervised semantic segmentation (SSS) methods suboptimal, as they are generally limited by a "one-to-one" relationship, where each image is independently associated with its GT. Such limitation may lead to error accumulation in low-contrast regions, further exacerbating confirmation bias. To address this issue, we revisit the SSS pipeline from a group-oriented perspective and propose a human-inspired solution: the Intra-group Consistency Augmentation Framework (ICAF). First, we experimentally validate the inherent consistency constraints within CdZnTe groups, establishing a group-oriented baseline using the Intra-group View Sampling (IVS). Building on this insight, we introduce the Pseudo-label Correction Network (PCN) to enhance consistency representation, which consists of two key modules. The View Augmentation Module (VAM) improves boundary details by dynamically synthesizing a boundary-aware view through the aggregation of multiple views. In the View Correction Module (VCM), this synthesized view is paired with other views for information interaction, effectively emphasizing salient regions while minimizing noise. Extensive experiments demonstrate the effectiveness of our solution for CdZnTe materials. Leveraging DeepLabV3+ with a ResNet-101 backbone as our segmentation model, we achieve a 70.6% mIoU on the CdZnTe dataset using only 2 group-annotated data (5‰). The code is available at https://github.com/pipixiapipi/ICAF.

Fields of Study & Subjects

Advanced Neural Network Applications Domain Adaptation and Few-Shot Learning Machine Learning and Algorithms

Publication details

Journal / source
IEEE Transactions on Image Processing
Volume
35
Pages
759–769
Publication date
1 January 2026
Language
EN