Topology-Guided Semantic Face Center Estimation for Rotation-Invariant Face Detection

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Authors: Hathai Kaewkorn, Lifang Zhou, Weisheng Li, Chengjiang Long
Cited by: 4
References: 39

Abstract

Face detection accuracy significantly decreases under rotational variations, including in-plane (RIP) and out-of-plane (ROP) rotations. ROP is particularly problematic due to its impact on landmark distortion, which leads to inaccurate face center localization. Meanwhile, many existing rotation-invariant models are primarily designed to handle RIP, they often fail under ROP because they lack the ability to capture semantic and topological relationships. Moreover, existing datasets frequently suffer from unreliable landmark annotations caused by imperfect ground truth labeling, the absence of precise center annotations, and imbalanced data across different rotation angles. To address these challenges, we propose a topology-guided semantic face center estimation method that leverages graph-based landmark relationships to preserve structural integrity under both RIP and ROP. Additionally, we construct a rotation-aware face dataset with accurate face center annotations and balanced rotational diversity to support training under extreme pose conditions. Next, we introduce a Hybrid-ViT model that fuses CNN spatial features with transformer-based global context and employ a center-guided module for robust landmark localization under extreme rotations. In order to evaluate center quality, we further design a hybrid metric that combines topological geometry with semantic perception for a more comprehensive evaluation of face center accuracy. Finally, experimental results demonstrate that our method outperforms state-of-the-art models in cross-dataset evaluations. Code: https://github.com/Catster111/TCE_RIFD.

Fields of Study & Subjects

Face recognition and analysis Face Recognition and Perception Face and Expression Recognition

Publication details

Journal / source
IEEE Transactions on Image Processing
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
35
Pages
998–1010
Publication date
1 January 2026
Language
EN