Principal Component Maximization: A Novel Method for SAR Image Recovery From Raw Data Without System Parameters

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Authors: Huizhang Yang, Liyuan Chen, Shao-Shan Zuo, Z. W. Liu, Jian Yang
Cited by: 2
References: 21

Abstract

Synthetic Aperture Radar (SAR) imaging relies on using focusing algorithms to transform raw measurement data into radar images. These algorithms require knowledge of SAR system parameters, such as wavelength, center slant range, fast time sampling rate, pulse repetition interval, waveform, and platform speed. However, in non-cooperative scenarios or when metadata is corrupted, these parameters are unavailable, rendering traditional algorithms ineffective. To address this challenge, this article presents a novel parameter-free method for recovering SAR images from raw data without the requirement of any SAR system parameters. Firstly, we introduce an approximated matched filtering model that leverages the shift-invariance properties of SAR echoes, enabling image formation via convolving the raw data with an unknown reference echo. Secondly, we develop a Principal Component Maximization (PCM) method that exploits the low-dimensional structure of SAR signals to estimate the reference echo. The PCM method employs a three-stage procedure: 1) segment raw data into blocks; 2) normalize the energy of each block; and 3) maximize the principal component's energy across all blocks, enabling robust estimation of the reference echo under non-stationary clutter. Experimental results on various SAR datasets demonstrate that our method can effectively recover SAR images from raw data without any system parameters. To facilitate reproducibility, the Matlab program is available at https://github.com/huizhangyang/pcm.

Fields of Study & Subjects

Advanced SAR Imaging Techniques Sparse and Compressive Sensing Techniques Synthetic Aperture Radar (SAR) Applications and Techniques

Publication details

Journal / source
IEEE Transactions on Image Processing
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
35
Pages
1231–1245
Publication date
1 January 2026
Language
EN