DepMatch: Boosting Semi-Supervised Semantic Segmentation by Exploring Depth Difference Knowledge

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Authors: Jianjian Yin, Xiruo Jiang, Tao Chen, Gensheng Pei, Yazhou Yao, Fumin Shen, Heng-Tao Shen
Cited by: 5
References: 77

Abstract

Existing semi-supervised semantic segmentation (SSS) methods fail to explore the potential of depth information in unlabeled data, as they suffer from 1) inter-class depth similarity, and 2) intra-class depth discrepancy. To address these challenges, this paper proposes DepMatch, a simple yet effective approach that leverages depth difference knowledge to guide consistency learning. Specifically, a Class-wise Depth Disparity Perception (CDDP) module is designed to exploit depth difference information, driven by class prediction priors, facilitating robust feature learning. Depth-feature discrepancy set is first constructed and then reliable pixel pairs are selected for inter-class depth disparity knowledge distillation. Simultaneously, exponential normalization is applied to intra-category depth disparity for suppressing large outlier variations, and an entropy-based adaptive weight is derived to prioritize feature learning of high entropy areas. Moreover, we propose the Uncertain Logit Disparity Regulation (ULDR) module, which leverages the depth variations at class boundaries to promote the mutual regulation of uncertain pixel logit information, enhancing the model's spatial understanding. Experiments on five public benchmarks show that DepMatch can be seamlessly incorporated as a plug-and-play plugin into popular SSS frameworks, achieving significant performance improvements across various visual encoders. The source code and models are made available at https://github.com/NUST-Machine-Intelligence-Laboratory/DepMatch.

Fields of Study & Subjects

Advanced Vision and Imaging Advanced Image and Video Retrieval Techniques Domain Adaptation and Few-Shot Learning

Publication details

Journal / source
IEEE Transactions on Image Processing
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
35
Pages
3256–3270
Publication date
1 January 2026
Language
EN