XMatchAD: A Cross-Modal Matching Perspective on Reconstruction-Based Anomaly Detection

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Authors: Mingxiu Cai, Zhe Zhang, Gaochang Wu, Tianyou Chai
Cited by: 1
References: 53

Abstract

The remarkable success of reconstruction-based methods in Unsupervised Anomaly Detection (UAD) lies in their ability to identify and localize anomalies by modeling discrepancies between input images and their reconstructed counterparts. However, these approaches often struggle to capture subtle anomalies and tend to produce blurred anomaly boundaries, which significantly limits their effectiveness, particularly in complex multi-class scenarios. To address these issues, we present XMatchAD, a novel UAD framework that reinterprets the task from a pseudo cross-modal matching perspective. Specifically, the input and reconstructed images are treated as two complementary modalities and their matching relationships are precisely exploited for anomaly detection. First, a pre-trained feature extractor is employed to encode discriminative representations. Second, an attention-guided cross-modal matching mechanism is introduced to match local inter-modal anomaly-related patterns while mutually refining the features. This enhances the sensitivity to anomalies with diverse shapes and subtle deviations and significantly improves the precision of anomaly detection and localization. Third, we design an adaptive frequency-aware fusion module that further delineates sharp anomaly boundaries through the coupling of high-frequency components from cross-modal multi-scale representations. Comprehensive evaluations on MVTec-AD, VisA, and MPDD benchmarks demonstrate that our method consistently achieves superior performance, outperforming state-of-the-art methods in multi-class anomaly detection and localization. The code will be released at https://github.com/Mingxiu-Cai/XMatchAD.

Fields of Study & Subjects

Anomaly Detection Techniques and Applications Machine Learning and Data Classification Software Testing and Debugging Techniques

Publication details

Journal / source
IEEE Transactions on Image Processing
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
35
Pages
8443–8455
Publication date
1 January 2026
Language
EN