PSense: Paper Material Sensing With MIMO mmWave Radar via Dual-Model Transfer Learning

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Authors: Fahim Niaz, Jian Zhang, Muhammad Bin Younas, Muhammad Khalid, Ashfaq Niaz, Umer Zukaib
Cited by: 3
References: 53

Abstract

Accurate authentication of paper-based materials is crucial for secure document verification, counterfeit currency detection, and intelligent packaging across industries such as finance, logistics, and security. Differentiating between subtle variations, such as glossy, recycled, coated, or counterfeit paper, remains a significant challenge due to minimal material-level differences. We introduce PSense, the first millimeter-wave MIMO radar-based sensing framework for paper material analysis, offering a fully contactless solution that relies solely on reflected signals, eliminating the need for transmission-based or dual-sided setups. To characterize intrinsic paper properties, we propose a novel material-sensitive feature called the Energy Reflection Ratio (ERR), which encodes key physical interactions including surface reflectivity, internal attenuation, and dispersion, uniquely capturing the electromagnetic signature of each paper type. We further present Trans-PapNet, a dual-model transfer learning framework designed to enhance classification robustness and generalization. One model extracts spatial and spectral patterns from radar signal scalograms using ResNet-50, while the other processes ERR-based physical features. These complementary representations are fused via a shared attention mechanism, enabling effective domain adaptation across paper types. Our method achieves an overall classification accuracy of 97.85%, with strong performance in three knowledge-based transfer scenarios (94.8%, 93.0%, and 90.0%) and under both seen and unseen material conditions (95.3%). These results underscore PSense's robustness and scalability, paving the way for real-world deployment in mobile, secure, and intelligent paper-based authentication systems.

Fields of Study & Subjects

Microwave and Dielectric Measurement Techniques Microwave Imaging and Scattering Analysis RFID technology advancements

Publication details

Journal / source
IEEE Transactions on Mobile Computing
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
25
Issue
9
Pages
14381–14396
Publication date
30 March 2026
Language
EN