Cross-Phase RUL Prediction via Degradation-Aware Continual Learning With Gradient Shift Detection and Dynamic Memory Adjustment
Fields of Study & Subjects
Domain Adaptation and Few-Shot Learning
Advanced Neural Network Applications
Machine Learning and ELM
Publication details
- Journal / source
- IEEE/ASME Transactions on Mechatronics
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Pages
- 1–11
- Publication date
- 1 January 2026