A High-Performance Self-Collimation SPECT for Small Animal Imaging

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Authors: Debin Zhang, Zhenlei Lyu, Tianpeng Xu, Peng Fan, Zerui Yu, Qiqi Ye, Yifan Hu, Jing Wu, Qingyang Wei, Xin Zhang, Qianqian Gan, Yang Xu
+6 more Li Wang, Rutao Yao, Min-Fu Yang, Zuo-Xiang He, Yaqiang Liu, Tianyu Ma
Cited by: 1
References: 50

Abstract

Stemmed from our novel single-photon imaging concept of detector self-collimation—which leverages detectors themselves as collimators to overcome the inherent resolution-sensitivity trade-off in conventional SPECT—this study presents the design and evaluation of the first full-ring self-collimation SPECT (SC-SPECT) scanner for small animal imaging. The system features four concentric detector rings and two interchangeable high-aperture-ratio tungsten collimator rings optimized for high-resolution (HR) and general-purpose (GP) imaging applications. Detector rings contain 480, 720, 960, and 1,200 evenly distributed GAGG(Ce) scintillators, each measuring 0.84 mm (tangential) × 6 mm (radial) × 20 mm (axial) and separated by 0.84-mm gaps to enable effective photon collimation. Inner detector rings and the collimator ring collectively provide collimation for photons reaching subsequent outer rings. Dual-end SiPM readouts facilitate axial depth-of-interaction measurements. Phantom and mouse studies are performed to assess the system’s resolution, sensitivity, and field-of-view volume, and SC-SPECT demonstrates generally superior performance compared with state-of-the-art small-animal SPECT systems. Mouse bone images using99mTc-MDP show CT-like resolution, clearly delineating detailed tracer uptake distributions within small structures such as mouse paws and skulls, indicating a significant technological advancement in small-animal SPECT imaging.

Fields of Study & Subjects

Medical Imaging Techniques and Applications Radiation Detection and Scintillator Technologies CCD and CMOS Imaging Sensors

Publication details

Journal / source
IEEE Transactions on Medical Imaging
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
45
Issue
5
Pages
2403–2413
Publication date
16 January 2026
Language
EN