Accurate Extraction of Equivalent Circuit Parameters for RF Inductors and Capacitors Using Decoupling TRL With Generalized Q -Factor Solution

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Authors: Shichen Liang, Xin Gu, Chenbo Shi, Qian Ren, Yanhui Liu
Cited by: 1
References: 26

Abstract

This article presents a method for the precise extraction of equivalent circuit parameters of surface-mounted inductors and capacitors. First, when testing these components using a microstrip fixture structure, in addition to leveraging the existing thru-reflect-line (TRL) calibration kits and algorithms, it is pointed out that the parasitic effects introduced during the fixture testing process need to be further considered. By modeling the parasitic effects circuitally and utilizing the fixture design information and redundant information in the TRL calibration kits, these parasitic effects are further eliminated to restore the true impedance of the surface-mounted circuit components. Subsequently, the equivalent circuit topology models of inductors/capacitors are, respectively, considered asRLCparallel/RLCseries models. To solve the model parameters for different models based on the accurate impedance obtained above. Existing$Q$-factor solutions have significant limitations, such as the need for interpolation, failure to effectively utilize test frequency information and high vulnerability to noise and errors. A generalized$Q$value solution is proposed to address the abovementioned issues. This solution obtains the optimal model parameters by fitting frequency-domain data. The equivalent circuit parameter extraction methods for inductors and capacitors are verified through simulations and practical measurements, demonstrating that the proposed method significantly outperforms traditional and existing approaches.

Fields of Study & Subjects

Microwave and Dielectric Measurement Techniques Electromagnetic Compatibility and Measurements Electromagnetic Compatibility and Noise Suppression

Publication details

Journal / source
IEEE Transactions on Microwave Theory and Techniques
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
74
Issue
4
Pages
3730–3742
Publication date
12 January 2026