Analysis of High-Energy Heavy-Ion SEE Results Through Standard-Energy Ion SEE Data

IEEE Transactions on Nuclear Science 2026 Open access

Read full text
Authors: Mario Sacristán Barbero, Ivan Slipukhin, Daniel Söderström, Natalia Emriskova, Andreas Waets, Kacper Biłko, Daniel Prelipcean, Andrea Coronetti, Heikki Kettunen, M. Sivertz, Frédéric Saigné, Vincent Pouget
+1 more Rubén García Alia
DOI: 10.1109/tns.2026.3651184
Cited by: 1
References: 21

Abstract

This work presents the results of several SEE measurements (bit upsets, latch-up and burn-out) performed in two Single Event Effect testing facilities, CERN and NSRL (100-1000 MeV/n), using high-energy heavy ions. The results are compared to those obtained at other SEE facilities using standard-energy ions, RADEF, UCL and GANIL (

Fields of Study & Subjects

Particle accelerators and beam dynamics Radiation Effects in Electronics Radiation Therapy and Dosimetry

Publication details

Journal / source
IEEE Transactions on Nuclear Science
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
73
Issue
4
Pages
1032–1042
Publication date
5 January 2026
Language
EN