Bounding SEL Rates for Null Results and Other Limited Test Data

IEEE Transactions on Nuclear Science 2026

View at publisher

Authors: Ray L. Ladbury, Matthew B. Joplin, Jean‐Marie Lauenstein

DOI: 10.1109/tns.2026.3662106

Cited by: 1

References: 21

Fields of Study & Subjects

Psychometric Methodologies and Testing VLSI and Analog Circuit Testing Statistical Methods and Bayesian Inference

References 21