Radiation-Hardened-by-Design Techniques to Mitigate Inductor-Originated Single-Event Frequency Transients in CMOS LC-Tank Oscillators

IEEE Transactions on Nuclear Science 2026

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Authors: Gideon Adom-Bamfi, Stefan Biereigel, E. Tackx, Paul Leroux, Jeffrey Prinzie

DOI: 10.1109/tns.2026.3674395

Cited by: 0

References: 28

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Radiation Effects in Electronics Radio Frequency Integrated Circuit Design Particle Detector Development and Performance

References 28