Bayesian Statistical Method for Quantifying the Uncertainty on the Measurement of Single Event Effects

IEEE Transactions on Nuclear Science 2026

View at publisher
Authors: Neil Rostand, Arthur Losquin, Jean -Luc Rebourg, Thomas Jarrin, Olivier Duhamel, Mohammadreza Rezaei, Juan Carlos Fabero, Juan Antonio Clemente, Sébastien Vigne
DOI: 10.1109/tns.2026.3726603
Cited by: 1
References: 19

Fields of Study & Subjects

Probabilistic and Robust Engineering Design Probability and Risk Models Radiation Effects in Electronics

Publication details

Journal / source
IEEE Transactions on Nuclear Science
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
73
Issue
9
Pages
1–1
Publication date
1 January 2026