MoE 2 : Optimizing Collaborative Inference for Edge Large Language Models

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Authors: Lyudong Jin, Yanning Zhang, Yanhan Li, Shuna Wang, Howard H. Yang, Jian Wu, Meng Zhang
Cited by: 9
References: 52

Abstract

Large language models (LLMs) have demonstrated remarkable capabilities across a wide range of natural language processing tasks. Exploiting the heterogeneous capabilities of edge LLMs is crucial for diverse emerging applications, as it enables greater cost-effectiveness and reduced latency. In this work, we introduceMixture-of-Edge-Experts (MoE2), a novel collaborative inference framework for edge LLMs. We formulate a joint gating and expert selection problem to optimize inference performance under energy and latency constraints. Unlike conventional MoE problems, LLM expert selection becomes significantly more challenging due to the combinatorial nature and the heterogeneity of edge LLMs across various attributes. To this end, we propose a two-level expert selection mechanism through which we uncover an optimality-preserving property of gating parameters across expert selections. This property enables the decomposition of the training and selection processes, significantly reducing complexity. Furthermore, we leverage the objective’s monotonicity and design a discrete monotonic optimization algorithm for optimal expert selection. We implement edge servers with NVIDIA Jetson AGX Orins and NVIDIA RTX 4090 GPUs, and perform extensive experiments. Our results validate the performance improvements for various LLM models and show that our MoE2 method can achieve optimal trade-offs among different delay and energy budgets, and outperforms baselines under various system resource constraints. We further demonstrate its strong robustness in dynamic, non-stationary environments and its effectiveness in achieving load balancing.

Fields of Study & Subjects

Topic Modeling Machine Learning in Healthcare Advanced Graph Neural Networks

Publication details

Journal / source
IEEE Transactions on Networking
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
34
Pages
4637–4651
Publication date
1 January 2026