First-Order Cross-Domain Meta Learning for Few-Shot Remote Sensing Object Classification

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Authors: Wenda Zhao, Yunxiang Li, Haipeng Wang, Huchuan Lu
Cited by: 3
References: 45

Abstract

Remote sensing images exhibit intrinsic domain complexity arising from multi-source sensor variances, which heterogeneity fundamentally challenges conventional cross-domain few-shot methods that assume simple distribution shifts. Addressing this, we propose a first-order Cross-Domain Meta Learning (CDML) for few-shot remote sensing object classification. CDML implements a dual-stage domain adaptation task as the fundamental meta-learning unit, and includes a cross-domain meta-train phase (CDMTrain) and a cross-domain meta-test phase (CDMTest). In CDMTrain, we propose an inner-loop multi-domain few-shot task sampling, which enables a teacher model encapsulate both cross-category discriminative features and authentic inter-domain distributional divergence. This alternating cyclic learning paradigm captures genuine domain shifts, with each update direction progressively guiding the model toward parameters that balance multi-domain performance. In CDMTest, we evaluate a domain diversity enhancement by transferring teacher parameters to the student model for cross-domain capability assessment on the reserved pseudo-unseen domain. The task-level design progressively improves domain generalization through iterative domain adaptive task learning. Meanwhile, to mitigate the conflicts and inadequacies caused by multi-domain scenarios, we propose a learnable affine transformation model. It adaptively learns affine transformation parameters through intermediate layer features to fine-tune the update direction. Extensive experiments on five remote sensing classification benchmarks demonstrate a superior performance of the proposed method compared with the state-of-the-art methods.

Fields of Study & Subjects

Domain Adaptation and Few-Shot Learning Remote-Sensing Image Classification Advanced Neural Network Applications

Publication details

Journal / source
IEEE Transactions on Pattern Analysis and Machine Intelligence
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
48
Issue
6
Pages
6365–6379
Publication date
21 January 2026
Language
EN