ZUMA: Training-Free Zero-Shot Unified Multimodal Anomaly Detection
Abstract
Multimodal anomaly detection (MAD) aims to exploit both texture and spatial attributes to identify deviations from normal patterns in complex scenarios. However, zero-shot (ZS) settings arising from privacy concerns or confidentiality constraints present significant challenges to existing MAD methods. To address this issue, we introduce ZUMA, a training-free, Zero-shot Unified Multimodal Anomaly detection framework that unleashes CLIP's cross-modal potential to perform ZS MAD. To mitigate the domain gap between CLIP's pretraining space and point clouds, we propose cross-domain calibration (CDC), which efficiently bridges the manifold misalignment through source-domain semantic transfer and establishes a hybrid semantic space, enabling a joint embedding of 2D and 3D representations. Subsequently, ZUMA performs dynamic semantic interaction (DSI) to enable structural decoupling of anomaly regions in the high-dimensional embedding space constructed by CDC, where natural languages serve as semantic anchors to help DSI establish discriminative hyperplanes within hybrid modality representations. Within this framework, ZUMA enables plug-and-play detection of 2D, 3D or multimodal anomalies, without training or fine-tuning even for cross-dataset or incomplete-modality scenarios. Additionally, to further investigate the potential of the training-free ZUMA within the training-based paradigm, we develop ZUMA-FT, a fine-tuned variant that achieves notable improvements with minimal parameter trade-off. Extensive experiments are conducted on two MAD benchmarks, MVTec 3D-AD and Eyecandies. Notably, the training-free ZUMA achieves state-of-the-art (SOTA) performance on both datasets, outperforming existing ZS MAD methods, including training-based approaches. Moreover, ZUMA-FT further extends the performance boundary of ZUMA with only 6.75 M learnable parameters.
Fields of Study & Subjects
Anomaly Detection Techniques and Applications
Domain Adaptation and Few-Shot Learning
Machine Learning and Data Classification
Publication details
- Journal / source
- IEEE Transactions on Pattern Analysis and Machine Intelligence
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Volume
- 48
- Issue
- 6
- Pages
- 6601–6614
- Publication date
- 29 January 2026
- Language
- EN