Learning With Partial and Noisy Correspondence in Graph Matching
Abstract
The success of existing graph matching methods heavily relies on high-quality training data with complete and precise correspondences between keypoints across different graphs. However, this assumption is often violated in real-world scenarios, leading to partial correspondence and noisy correspondence challenges. In brief, partial correspondence arises from viewpoint occlusions, where certain keypoints (i.e., outliers) lack valid counterparts in the target graph, while noisy correspondence refers to both incorrectly established (i.e., false positives) and neglected (i.e., false negatives) correspondences due to annotation error. In this paper, we propose the first unified framework to address both partial and noisy correspondence challenges in graph matching. Specifically, we introduce a dual-expert cooperative framework that integrates Koopmans-Beckmann and Lawler's quadratic assignment programming formulations (KB-QAP and L-QAP) through an align-fuse-refine pipeline. In the alignment stage, the KB-QAP expert aligns keypoints and distinguishes inliers from outliers using a novel quadratic contrastive loss. In the fusion stage, the L-QAP expert employs a graph transformer on the association graph to merge the aligned graphs and incorporates a learnable outlier-rejection mechanism to handle partial correspondences. Finally, by exploiting the different noise resistances of the two experts, we identify and refine the false positive and false negative correspondences, thereby enhancing robustness against noisy correspondence. Extensive experiments on four widely-used graph matching datasets demonstrate the effectiveness of our method against 17 competitive baselines in both partial and noisy correspondence scenarios.
Fields of Study & Subjects
Graph Theory and Algorithms
Advanced Graph Neural Networks
Data Quality and Management
Publication details
- Journal / source
- IEEE Transactions on Pattern Analysis and Machine Intelligence
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Volume
- 48
- Issue
- 7
- Pages
- 8234–8249
- Publication date
- 9 March 2026
- Language
- EN