Learning With Partial and Noisy Correspondence in Graph Matching

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Authors: Yijie Lin, Mouxing Yang, Peng Hu, Jiancheng Lv, Hao Chen, Xi Peng
Cited by: 3
References: 81

Abstract

The success of existing graph matching methods heavily relies on high-quality training data with complete and precise correspondences between keypoints across different graphs. However, this assumption is often violated in real-world scenarios, leading to partial correspondence and noisy correspondence challenges. In brief, partial correspondence arises from viewpoint occlusions, where certain keypoints (i.e., outliers) lack valid counterparts in the target graph, while noisy correspondence refers to both incorrectly established (i.e., false positives) and neglected (i.e., false negatives) correspondences due to annotation error. In this paper, we propose the first unified framework to address both partial and noisy correspondence challenges in graph matching. Specifically, we introduce a dual-expert cooperative framework that integrates Koopmans-Beckmann and Lawler's quadratic assignment programming formulations (KB-QAP and L-QAP) through an align-fuse-refine pipeline. In the alignment stage, the KB-QAP expert aligns keypoints and distinguishes inliers from outliers using a novel quadratic contrastive loss. In the fusion stage, the L-QAP expert employs a graph transformer on the association graph to merge the aligned graphs and incorporates a learnable outlier-rejection mechanism to handle partial correspondences. Finally, by exploiting the different noise resistances of the two experts, we identify and refine the false positive and false negative correspondences, thereby enhancing robustness against noisy correspondence. Extensive experiments on four widely-used graph matching datasets demonstrate the effectiveness of our method against 17 competitive baselines in both partial and noisy correspondence scenarios.

Fields of Study & Subjects

Graph Theory and Algorithms Advanced Graph Neural Networks Data Quality and Management

Publication details

Journal / source
IEEE Transactions on Pattern Analysis and Machine Intelligence
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
48
Issue
7
Pages
8234–8249
Publication date
9 March 2026
Language
EN