Decoupled Degradation Monitoring of IGBT Modules Based on Temperature-Quantified Indicators

IEEE Transactions on Power Electronics 2026

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Authors: Xinglai Ge, Yinda Liao, Dong Xie, Zhiliang Xu, Qianxia Ke, Huimin Wang, Yi Zhang, Josef Lutz, Thomas Basler
DOI: 10.1109/tpel.2026.3662375
Cited by: 2
References: 32

Fields of Study & Subjects

Silicon Carbide Semiconductor Technologies Photovoltaic System Optimization Techniques Power Transformer Diagnostics and Insulation

Publication details

Journal / source
IEEE Transactions on Power Electronics
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Pages
1–15
Publication date
1 January 2026