A Novel Ultrahigh Current Whole-Wafer Press-Pack Power Semiconductor With Δ-Pack Structure

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Authors: Xinling Tang, Zhongkang Lin, Jingfei Wang, Xiaoguang Wei, Guang Yang, Anqi Dai, Wei Hao, Yulin Gu, Yuhou Sun, Hao shi
Cited by: 1
References: 11

Abstract

Benefiting from simpler, more reliable, and higher power density packaging, Press-pack (PP) power semiconductors are gradually becoming the mainstream choice for high-power power electronic conversion, and have been widely applied in scenarios such as high-voltage direct current transmission, large scale industrial variable frequency drives, and shipboard/railway traction systems. To meet the future demand for larger-capacity power conversion, the voltage and current of semiconductor chips have physical limitations, making it difficult to further improve the device power. Based on the principle of parallel thermal resistance, 4-layer structure and novel Copper-Diamond electrode material, this paper proposes a novel Δ-pack PP-device with ultra-high current. The effectiveness of proposed method has been verified through calculations and experiments, the thermal resistance of the press-pack integrated gate-commutated thyristor (PP-IGCT) device is reduced from 4.6 K/kW to 1.7 K/kW, and the current is increased by more than 88% from 2.76 kA to 5.2 kA.

Fields of Study & Subjects

Silicon Carbide Semiconductor Technologies Advancements in Semiconductor Devices and Circuit Design GaN-based semiconductor devices and materials

Publication details

Journal / source
IEEE Transactions on Power Electronics
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
41
Issue
9
Pages
14323–14328
Publication date
4 March 2026